| Index | Equipment | Description |
| 1 | High-power rotating target X-ray diffractometer | Grazing incidence XRD, residual stress, conventional XRD scanning, qualitative and quantitative phase analysis, crystallinity, accurate calculation of lattice parameters, grain size (microstrain), Rietveld structure refinement, etc. |
| 2 | High-power rotating target X-ray diffractometer | Grazing incidence XRD, conventional XRD scanning, qualitative and quantitative phase analysis, crystallinity, accurate calculation of lattice parameters, grain size (microstrain), Rietveld structure refinement, etc. |
| 3 | High-resolution powder X-ray diffractometer | Conventional XRD scanning, qualitative and quantitative phase analysis, crystallinity, accurate calculation of lattice parameters, grain size (microstrain), Rietveld structure refinement, etc. |
| 4 | Micro-focused two-dimensional X-ray diffractometer | Micro-area XRD analysis, residual stress determination, texture determination, high-throughput XRD characterization, etc. |
| 5 | In-situ X-ray diffractometer | XRD under different atmospheres and temperatures; in-situ chemical reaction and electrocatalytic XRD studies; study of crystal structure evolution under electric fields. |
| 6 | High-resolution X-ray diffractometer | 1. Grazing incidence diffraction (GID) for precise analysis of composition, order, and orientation in multilayer films; 2. X-ray reflectivity analysis (XRR) for precise analysis of thickness, density, and roughness in polycrystalline and single-crystal multilayer films; 3. High-resolution XRD (HRXRD) for rocking curve, reciprocal space mapping analysis in high-quality epitaxial films and single-crystal materials; 4. Annealing studies and high-resolution XRD characterization at high temperatures for epitaxial films and other materials. |
| 7 | Micro-focused rotating target single-crystal X-ray diffractometer | 1. Characterization of atomic coordinates, bond lengths, bond angles, configurations, thermal vibrations, and electron distributions in single crystals; 2. Characterization of microstructures such as atomic occupancy, defects, and bonding interactions; 3. Structural analysis of single crystals at medium and low temperatures. |
| 8 | Laser scanning confocal Raman spectroscopy | 1. Microscopic Raman spectroscopy measurements of powders, bulk materials, liquids, etc., and fluorescence spectroscopy measurements (473nm-1000nm); 2. Dispersive multi-point, line, and area scanning and confocal depth scanning for compositional distribution, stress distribution, etc.; 3. In-situ Raman spectroscopy measurements under temperature variations, in-situ electrocatalysis, and in-situ measurements in lithium (empty) batteries; 4. Polarized Raman spectroscopy measurements; 5. Raman spectroscopy characterization of large-sized samples; 6. Coupling with atomic force microscopy to simultaneously obtain morphological and compositional information for tip-enhanced Raman scattering (TERS). |
| 9 | Upright/inverted atomic force microscope | 1. Obtaining three-dimensional surface morphology of samples under ambient conditions without causing damage; 2. Various imaging modes including lateral force, phase, electrostatic force, piezoelectric force, and surface potential for characterization of dispersed multi-point, line, and area electrical/magnetic/mechanical properties (PFM/MFM/STM, etc.); 3. AFM characterization under high |
| 10 | Three-dimensional X-ray microscope | Two-dimensional tomography scanning and three-dimensional non-destructive imaging for studying microstructures and defects of samples, including morphology, porosity, cracks, etc. |
| 11 | High-resolution X-ray microscope | 1. Defect analysis: distribution of microcracks in materials, bonding degree of matrix, morphology of interfaces, local fiber orientation and thickness, particle size and shape, simulation of nucleation, growth, and coalescence processes. 2. Three-dimensional morphology analysis: characterization of pore size, distribution, types and twisting of fibers, qualitative and quantitative characterization of microstructure parameters such as porosity, pore connectivity, and pore size, and 3D reconstruction of materials. |
| 12 | Field-emission scanning electron microscope (FE-SEM) | Surface or cross-section morphological observation of solid samples, fibers, films, etc.; observation and size analysis of micro/nano-particles, pores, etc.; analysis of element composition and distribution in micro-areas of the sample. |
| 13 | X-ray photoelectron spectroscopy (XPS) | XPS is primarily used for the qualitative and semi-quantitative analysis of the types, chemical states, chemical environments, and relative concentrations of elements within approximately 10 nm of a solid sample surface. It has wide applications in various disciplines related to solid materials, including polymers, metals, semiconductors, and thin films. |
| 14 | Field-emission transmission electron microscope (FE-TEM) | Analysis of microstructures within materials; analysis of element composition and distribution in micro-areas of the sample; analysis of material microstructures under heating or freezing conditions; in situ electrical and mechanical property testing of one-dimensional nano-materials. |
| 15 | Field-emission transmission electron microscope (FE-TEM) | Analysis of microstructures within materials; analysis of element composition and distribution in micro-areas of the sample; TEM and STEM mode for three-dimensional reconstruction. |
| 16 | Transmission electron microscope (TEM) | Analysis of crystal defects, grain boundaries, phase boundaries, and other microstructures in metallic materials; analysis of morphological structures in polymer and composite materials; observation of particle shapes and size analysis; observation of shapes of chromosomes, ribosomes, proteins, hemoglobin, bacteria, etc. |
| 17 | Environmental scanning electron microscope (ESEM) | Surface morphology analysis of metallic, ceramic, polymer, and composite materials; surface morphology analysis of biological or aqueous samples (observation and analysis of samples without surface treatment); observation and size analysis of particles, porous materials, or fibers; qualitative and semi-quantitative analysis of surface micro-area composition of solid samples. |
| 18 | Scanning electron microscope (SEM) | Surface morphology observation of solid samples; analysis of fracture morphology and internal structure of materials; observation of particle or fiber shapes and size analysis. |
| 19 | Scanning probe microscope (SPM) | Analysis of surface morphology and phase composition of materials; analysis of various defects and contamination on material surfaces; study of surface mechanical properties; study of surface electrical and magnetic properties. |
| 20 | X-ray diffractometer (XRD) | Qualitative or quantitative phase analysis; crystal structure analysis; crystallinity determination (multiple peak separation method); grain orientation determination; study of phase transitions with temperature variation |
| 21 | Small-angle X-ray scattering instrument | Analysis of particle size, shape, and distribution of dispersed phases (particles, microcrystals, platelets, fillers, pores, and domains); analysis of particle dispersion state; study of interface structures; characterization of particle morphology in solution. |
| 22 | 600MHz Nuclear Magnetic Resonance (NMR) | Structural analysis of organic compounds; molecular structure analysis of natural products; analysis of biomolecular and protein structures; composition and chain structure analysis of polymer materials. |
| 23 | 400MHz Nuclear Magnetic Resonance (NMR) | Structural analysis of organic compounds and natural products; chain structure analysis of polymers; study of aggregation structures and polymer chain dynamics; study of interactions between polymer chains and compatibility of polymer blends. |
| 24 | Fourier Transform Infrared Spectrometer | Qualitative analysis of compounds; chain structure analysis of polymers; analysis of composition in mixtures; study of intermolecular interactions. |
| 25 | Fourier Transform Infrared Microscope | Qualitative analysis of trace samples; analysis of single fibers; analysis of composition distribution in micro-areas. |
| 26 | Gas Chromatography-Mass Spectrometry (GC-MS) | Structural analysis of organic compounds; qualitative and quantitative analysis of volatile organic mixtures; qualitative analysis of volatile organic compounds in water samples or solid samples; chain structure analysis of polymers; study of thermal degradation mechanisms of polymers. |
| 27 | Ultraviolet-Visible Spectrophotometer | Structural analysis of small molecule compounds; analysis of small molecule compound composition; transmission analysis of thin film samples; reflectance and transmission analysis of solutions, emulsions, or solid powders. |
| 28 | Inductively Coupled Plasma Emission Spectrometer (ICP-OES) | Determination of the content of more than 70 metallic and non-metallic elements in inorganic or organic samples, such as Cu, Pb, Cd, Cr, Ni, Zn, As, Fe, Bi, Ca, P, K, Mg, Al, Si, Sc, Sn, Mn, Zr, Ag, Ba, etc. |
| 29 | Elemental Analyzer | Determination of carbon, hydrogen, nitrogen, oxygen, and sulfur content in organic samples. |
| 30 | Inductively Coupled Plasma Mass Spectrometry (ICP-MS) | Determination of various metallic and non-metallic elements in inorganic or organic samples. |
| 31 | Glow Discharge Spectrometer (GDS) | Chemical element content analysis in matrices and coatings (films); elemental depth quantification for heat-treated workpieces (carburizing, nitriding); chemical element analysis in matrices covered by conductive or non-conductive coatings (films); analysis of chemical elements in solid samples covered by conductive or non-conductive coatings (films). |
| 32 | Steady-state/Transient Fluorescence Spectrometer | Chemical structure analysis of fluorescent substances; quantitative analysis of components with fluorescent properties; measurement of fluorescence quantum yield; determination of fluorescence lifetime and phosphorescence lifetime; time-resolved fluorescence spectroscopy; polarization properties of fluorescence. |
| 33 | Laser Micro-Raman Spectrometer | Determination of particle size and distribution of micelles, colloidal particles; determination of average molecular weight of polymers; study of molecular chain conformation and interactions with solvent molecules in polymer solutions; study of conformation and aggregation processes of proteins and polysaccharides. |
| 34 | Advanced Rotational Rheometer (ARES) | Determination of steady-state and dynamic rheological parameters for thermoplastic polymer melts; determination of rheological parameters for polymer solutions and other low-viscosity fluids; determination of rheological properties for shear-thinning fluids; determination of dielectric properties of polymers; determination of tensile properties of polymers. |
| 35 | Laser Micro-Raman Spectrometer (Micro-Raman) | Analysis of chemical structure of materials (non-destructive qualitative analysis); analysis of aggregate structure, phase transformation, and defects; analysis of surface composition distribution and depth distribution; study of changes in polymer structure, compatibility, stress relaxation, and interactions. |
| 36 | Gel Permeation Chromatography-Light Scattering Detector | Determination of absolute molecular weight and its distribution for polymers soluble in tetrahydrofuran. |
| 37 | Cryo-ultramicrotome | Preparation of semi-thin and ultra-thin sections, providing perfectly flat sections for optical microscopy, transmission electron microscopy, scanning electron microscopy, and atomic force microscopy. |
| 38 | Precision Ion Polishing System | Sample thinning and polishing for TEM samples of metals, ceramics, and semiconductors. |
| 39 | Microwave Digestion System | Sample pretreatment for ICP-OES, capable of digesting a wide range of organic or inorganic samples. |
