Large aperture phase shifting laser interferometer

The laser interferometer uses phase shift technology to accurately characterize the three-dimensional morphology of the measured surface, with a measurement accuracy of Pv up to 0.06 μ M is even higher and widely used for high-precision detection of planar optical components.

Applications

Widely used for high-precision detection of planar optical components.

Features

--Accurately measure the transmitted and reflected wavefronts of large aperture optical components.
--The measurement accuracy and repeatability are comparable to the American Zygo and 4D interferometers.
--Customized development according to customer requirements.

  • 主要技术指标


    技术参数产品系列

    测量方式

    测量口径

    移相方式

    主机波长

    透射平面参考镜面形误 差(PV)

    反射平面参考镜面形误

    差(PV)

    腔精度(PV)

    面形误差测量重复性 主相机分辨率

    主相机调焦能力

    测量高平行度光学元件

    透、反射波前

    工作温度要求    工作温度波动要求

    工作湿度要求

    隔震要求

    工作电压

    Φ300 移相数字化干涉仪

    菲索干涉原理

    300mm

    波长移相

    632.8nm

    ≤ λ/10,λ=632.8nm

    ≤ λ/10,λ=632.8nm

    ≤ λ/10,λ=632.8nm

    1nm  (2δ)

    2048*2048

    支持

    22℃ ±1℃

    每小时变化小于 1℃

    55%±10%RH

    气浮平台,固有频率:1-2Hz

    220V

    Φ600 移相数字化干涉仪

    菲索干涉原理

    600mm

    偏振移相或波长移

    660nm  632.8nm

    ≤ λ/10,λ=632.8nm ≤ λ/10,λ=632.8nm ≤ λ/10,λ=632.8nm

    1nm  (2δ)

    2048*2048

    支持

    22℃ ±1℃

    每小时变化小于 1℃

    55%±10%RH

    气浮平台,固有频率:1-2Hz

    220V


    Φ800 移相数字化干涉仪

    菲索干涉原理

    800mm

    偏振移相或波长移

    660nm  632.8nm

    ≤ λ/10,λ=632.8nm

    ≤ λ/10,λ=632.8nm

    ≤ λ/10,λ=632.8nm

    1nm  (2δ)

    2048*2048

    支持

    22℃ ±1℃

    每小时变化小于 1℃

    55%±10%RH

    气浮平台,固有频率:1-2Hz

    220V